Three-dimensional measurement system, inspection method,...

Details Three-dimensional measurement system, inspection method,... Three-dimensional measurement system, inspection method,...

2011-02-01

2011-02-01

Toatley, Gregory J (Department: 2877)

Optics: measuring and testing

Shape or surface configuration

Triangulation

C382S154000

Reexamination Certificate

active

07880899

ABSTRACT:
A three-dimensional measurement system comprises: a three-dimensional measuring device for obtaining measurement data related to the three-dimensional shape of a target object for measurement; a specification part for specifying a primitive of the target object based on annotation information contained in CAD data; and a controller for controlling the three-dimensional measuring device based on the primitive specified by the specification part.

REFERENCES:
patent: 5621807 (1997-04-01), Eibert et al.
patent: 5819016 (1998-10-01), Watanabe et al.
patent: 5845048 (1998-12-01), Masumoto
patent: 6101268 (2000-08-01), Gilliland
patent: 6948255 (2005-09-01), Russell
patent: 2002/0150288 (2002-10-01), Fujiwara
patent: 07225121 (1995-08-01), None
patent: 8-190575 (1996-07-01), None
patent: 2000-306111 (2000-11-01), None
Machine English translation of JP-H07-225121 (Oyama) from http://www.ipdl.inpit.go.jp/homepg—e.ipdl Sep. 20, 2009.

Affiliated with

Also associated with

Rating

Three-dimensional measurement system, inspection method,... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Three-dimensional measurement system, inspection method,..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Three-dimensional measurement system, inspection method,... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2618930