Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1994-11-08
1996-10-01
Evans, F. L.
Optics: measuring and testing
By polarized light examination
With light attenuation
382154, G01B 1124
Patent
active
055615260
ABSTRACT:
A measurement device or system (11) for determining features of a three-dimensional object (20) from two-dimensional images includes a projector (27) for projecting a pattern (73) upon the object (20), at least one imager (17, 19) for obtaining multiple sets of image data of the illuminated object (20) and a processor (47) for obtaining a three-dimensional image (81) of the object (20) from the multiple sets of data.
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Huber Edward D.
Williams Rick A.
Evans F. L.
Lockheed Missiles & Space Company Inc.
Radlo Edward J.
Violette J. P.
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