Three-dimensional measurement apparatus

Image analysis – Applications – 3-d or stereo imaging analysis

Reexamination Certificate

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Details

C356S012000, C359S462000, C345S419000

Reexamination Certificate

active

07486816

ABSTRACT:
A three-dimensional measurement apparatus of a slit light (or pseudo slit light) projection type that is adapted to prevent deterioration of measurement accuracy and to be easily miniaturized. Detected positions C1, C2are adopted that are determined so as to correspond to scanning lines on each of which a number of brightened pixels falls within an allowable range are detected. The allowable range varies from Nav × amin to Nav × amax or from Nav−β to Nav +γ, where Nav is an average of the numbers of brightened pixels detected on scanning lines for each of which at least one pixel is determined, and amin, amax, β, and γ are minimum proper ratio, maximum proper ratio, subtract number of pixels, and add number of pixels, respectively, which are set in advance as parameters.

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EP Search Report for corresponding EP Application No. 04256285.0-2213 mailed Jan. 28, 2005.
Notification of Grounds for Rejection (Office Action) in corresponding Japan Patent Application No. 356747/2003 mailed Apr. 11, 2006.
U.S. 6,909,799 corresponds to references AJ (EP 1 245 923 A2) and AK (EP 1 245 923 A3).

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