Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1998-06-29
2000-07-11
Kim, Robert H.
Optics: measuring and testing
By particle light scattering
With photocell detection
356359, G01B 902
Patent
active
060881003
ABSTRACT:
An absorption imaging spectrometer for providing a three-dimensional spectral image of a light-transmitting sample. Temporally incoherent light is used to illuminate the sample, with a portion of the beam split off as a reference beam and subsequently recombined with the return beam from the sample after a variable delay path. An optical configuration is provided for modulating a time delay of the reference beam, with the interferogram obtained at each surface of dielectric discontinuity within the sample being deconvolved to derive an absorption spectrum.
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Brenan Colin J. H.
Hunter Ian W.
Kim Robert H.
Massachusetts Institute of Technology
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