Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1988-12-22
1989-09-19
LaRoche, Eugene R.
Optics: measuring and testing
By polarized light examination
With light attenuation
356 2, G01B 1124
Patent
active
048675709
ABSTRACT:
Apparatus and method for obtaining three-dimensional information about an object, includes a first optical system, a projection device, a second optical system, and an image sensor. A plurality of pattern beams are radiated onto the object through the first optical system. Optical images formed by the pattern beams on the object are received by the image sensor through the second optical system to detect the positions of the received optical images. The distances from the detected positions of the optical images to a plurality of positions on the object are measured, thereby obtaining three-dimensional information about the object.
REFERENCES:
patent: 4051483 (1977-09-01), Suzuki
patent: 4746790 (1988-05-01), Sorimachi
patent: 4749848 (1988-06-01), Sorimachi
Sakamoto Yasurou
Sorimachi Kanehiro
Yamada Shigeru
Canon Kabushiki Kaisha
LaRoche Eugene R.
Pascal Robert J.
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