Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1993-12-13
1995-09-05
Pham, Hoa O.
Optics: measuring and testing
By polarized light examination
With light attenuation
2502017, G01B 1124
Patent
active
054483603
ABSTRACT:
A three-dimensional image measuring device which comprises a light source; a plane image forming unit for forming a plane image in a space in its depth direction .on the basis of light emitted from the light source; a scanning unit for moving and scanning the plane image formed by the plane image forming means in its depth direction; an object to be measured disposed in the space where the plane image is formed; a light receiving unit for measuring a strength of light scattered on a surface of the object as the plane image is moved and scanned and; a distance measuring unit for measuring the distance to the object on the basis of the output of the light receiving unit, whereby a three-dimensional image with least reduced invisible area is easily and accurately measured in a short time without using the principle of triangulation.
REFERENCES:
patent: 3592548 (1971-07-01), Majkowski
patent: 4199253 (1980-04-01), Ross
patent: 4657393 (1987-04-01), Stern
patent: 5054926 (1991-10-01), Dabbs et al.
patent: 5151609 (1992-09-01), Nakayawa et al.
patent: 5305092 (1994-04-01), Mimura et al.
Ando Manabu
Moriya Masato
Suzuki Toru
Terada Keiji
Wakai Hideyuki
Kabushiki Kaisha Komatsu Seisakusho
Pham Hoa O.
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