Geometrical instruments – Gauge – Pivoted probes
Patent
1989-12-14
1990-11-27
Cuchlinski, Jr., William A.
Geometrical instruments
Gauge
Pivoted probes
33556, 33561, G01B 1124, G01B 702
Patent
active
049725971
ABSTRACT:
A three-dimensional displacement gauge comprising a housing, a probe rotatably and slidably mounted on the housing, the probe is slidable along a first direction and having a contact member attached at one end thereof, two emitting members mounted on the probe each for emitting a light beam, two-dimensional measuring member such as a position sensor fixed to the housing for detecting the light beams, a biasing spring for biasing the probe toward the contact member, and a limit switch attached to the housing for detecting whether or not the probe moves in the first direction. The two-dimensional measuring member detects the light beams struck thereon so as to measure a small displacement of the contact member of the probe either in the first direction or in a second direction perpendicular to the first direction. In another mode, the two emitting members are mounted on the housing, and a mirror is mounted at the other end of the probe, and the two-dimensional measuring element detect the light beams struck thereon from the emitting members by way of the mirror.
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Kadosaki Masahiro
Sugimori Hiroshi
Taniguchi Katsuji
Tohbo Kihachiro
Yamada Shigeru
Cuchlinski Jr. William A.
Fulton Christopher W.
Governor of Toyama Prefecture, Yutaka Nakaoki
Kitamura Machinery Co. Ltd.
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