Three-dimensional displacement gage

Geometrical instruments – Gauge – Pivoted probes

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Details

33556, 33561, G01B 1124, G01B 702

Patent

active

049725971

ABSTRACT:
A three-dimensional displacement gauge comprising a housing, a probe rotatably and slidably mounted on the housing, the probe is slidable along a first direction and having a contact member attached at one end thereof, two emitting members mounted on the probe each for emitting a light beam, two-dimensional measuring member such as a position sensor fixed to the housing for detecting the light beams, a biasing spring for biasing the probe toward the contact member, and a limit switch attached to the housing for detecting whether or not the probe moves in the first direction. The two-dimensional measuring member detects the light beams struck thereon so as to measure a small displacement of the contact member of the probe either in the first direction or in a second direction perpendicular to the first direction. In another mode, the two emitting members are mounted on the housing, and a mirror is mounted at the other end of the probe, and the two-dimensional measuring element detect the light beams struck thereon from the emitting members by way of the mirror.

REFERENCES:
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patent: 3520063 (1970-07-01), Rethwish et al.
patent: 3766653 (1973-10-01), McKay, Sr.
patent: 3945124 (1976-03-01), Jacoby et al.
patent: 4130941 (1978-12-01), Amsbury
patent: 4495703 (1985-01-01), Sakata et al.
patent: 4513507 (1985-04-01), Laskowski
patent: 4530159 (1985-07-01), Ernst
patent: 4536661 (1985-08-01), McMurtry
patent: 4581826 (1986-04-01), Ernst
patent: 4882848 (1989-11-01), Breyer et al.

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