Thin thickness measurement method and apparatus

Optics: measuring and testing – Dimension – Thickness

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C356S429000

Reexamination Certificate

active

11018631

ABSTRACT:
Techniques for non-contacting thickness or caliper measurements of moving webs or sheets employ a sensor device that includes a first sensor head and a second sensor head that are spaced apart to define a path through which the moving web travels. The sensor device projects a laser generated, multiple points pattern onto the upper surface of the moving web. Pattern recognition algorithm analysis of the pattern identifies the orientation, e.g., tilt, of the moving web. The device further measures the film tilt, the distance between the first sensor head and the first web surface, the distance between the second sensor head and the second web surface, and the distance between the two sensor heads to provide a highly accurate on-line thickness measurement of the moving web.

REFERENCES:
patent: 3536405 (1970-10-01), Flower
patent: 3802774 (1974-04-01), Eschler et al.
patent: 4068955 (1978-01-01), Bodlaj
patent: 4160204 (1979-07-01), Holmgren et al.
patent: 4276480 (1981-06-01), Watson
patent: 4708483 (1987-11-01), Lorenz
patent: 4773760 (1988-09-01), Makkonen
patent: 4843481 (1989-06-01), Plummer
patent: 5210593 (1993-05-01), Kramer
patent: 5492601 (1996-02-01), Ostermayer et al.
patent: 5581353 (1996-12-01), Taylor
patent: 5606173 (1997-02-01), Concannon et al.
patent: 5694214 (1997-12-01), Watanabe et al.
patent: 5714763 (1998-02-01), Chase et al.
patent: 6038028 (2000-03-01), Grann et al.
patent: 6100986 (2000-08-01), Rydningen
patent: 6111649 (2000-08-01), Tominaga et al.
patent: 6281679 (2001-08-01), King et al.
patent: 6289600 (2001-09-01), Watts
patent: 6297879 (2001-10-01), Yang et al.
patent: 6441905 (2002-08-01), Tojyo et al.
patent: 6459488 (2002-10-01), Heffner
patent: 6476920 (2002-11-01), Scheiner et al.
patent: 6494446 (2002-12-01), Tomiyama et al.
patent: 6515746 (2003-02-01), Opsal et al.
patent: 6556306 (2003-04-01), Jiang et al.
patent: 6573999 (2003-06-01), Yang
patent: 6639201 (2003-10-01), Almogy et al.
patent: 6646752 (2003-11-01), Chen et al.
patent: 6690357 (2004-02-01), Dunton et al.
patent: 6700370 (2004-03-01), Chen et al.
patent: 6731380 (2004-05-01), Amara et al.
patent: 6744052 (2004-06-01), Petersson et al.
patent: 6757069 (2004-06-01), Bowles
patent: 6762846 (2004-07-01), Poris
patent: 2003/0007161 (2003-01-01), Bowles
patent: 0 843 155 (1998-05-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Thin thickness measurement method and apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Thin thickness measurement method and apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Thin thickness measurement method and apparatus will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3776890

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.