1985-11-22
1988-01-05
Davie, James W.
357 16, 357 20, 357 68, H01L 2714
Patent
active
047179465
ABSTRACT:
Photodiode structure and method of manufacturing the same, wherein the photodiode has a combination of very high shunt resistance and exceptionally low capacitance with only a slight loss in sensitivity. The diode junction is formed by a narrow line, and the geometry of the device can take many forms. The device has a typical shunt resistance of 150 megohms and a typical capacitance of 80 picofarads for an equivalent photosensitive area of 1 cm.sup.2, which cannot be achieved by current standard technology.
REFERENCES:
patent: 3733527 (1973-05-01), Migitaka et al.
patent: 3959646 (1976-05-01), de Cremous
patent: 4077819 (1978-03-01), Hutson
patent: 4091409 (1978-05-01), Wheatley, Jr.
Applied Solar Energy Corporation
Davie James W.
Epps Georgia Y.
LandOfFree
Thin line junction photodiode does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Thin line junction photodiode, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Thin line junction photodiode will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-11069