Electricity: measuring and testing – Magnetic – Magnetometers
Patent
1990-05-16
1991-09-24
Powell, William A.
Electricity: measuring and testing
Magnetic
Magnetometers
156644, 156657, G01R 3302, B44C 122, C23F 102
Patent
active
050516957
ABSTRACT:
A thin film vector magnetometer is configured to produce an output that ves linearly with the component of an externally applied magnetic field in the plane of a thin film chip portion thereof along a predefined sensitivity axis. The sensitivity and linear dynamic range of the thin film vector magnetometer are intimately related to each other through a bias field supplied by a bias magnet portion of the device. The bias field also defines the sensitivity axes of the magnetometer which is orthogonal to the unidirectional bias field supplied by the bias magnet.
REFERENCES:
patent: 3271665 (1966-09-01), Castro et al.
patent: 4470873 (1984-09-01), Nakamura
patent: 4533872 (1985-08-01), Boord et al.
patent: 4954216 (1990-09-01), Hunter et al.
Hunter Paul
Schwee Leonard J.
Powell William A.
Shuster Jacob
The United States of Americas as represented by the Secretary of
Walden Kenneth E.
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