Active solid-state devices (e.g. – transistors – solid-state diode – Non-single crystal – or recrystallized – semiconductor... – Amorphous semiconductor material
Patent
1997-12-17
2000-10-17
Abraham, Fetsum
Active solid-state devices (e.g., transistors, solid-state diode
Non-single crystal, or recrystallized, semiconductor...
Amorphous semiconductor material
257 72, 257347, 257348, 257349, 257350, 257351, 257352, H01L 2900
Patent
active
061335843
ABSTRACT:
A thin film transistor includes a substrate, a gate electrode, an insulating film, a semiconductor film, a source electrode, a drain electrode, wherein in at least one electrode of the gate electrode, the source electrode and the drain electrode, end portion of the at least one electrode is tapered in such a manner that a thickness decreases in a direction toward end face of the at least one electrode, the at least one electrode being composed of one electrode material, and prescribed physical property of the at least one electrode being changed in a direction perpendicular to a surface of the at least one electrode, so that an etching rate of the at least one electrode is changed in the direction.
REFERENCES:
patent: 5905274 (1999-05-01), Ahn et al.
Inoue Kazunori
Morita Takeshi
Nagata Hitoshi
Sakata Kazuyuki
Abraham Fetsum
Mitsubishi Denki & Kabushiki Kaisha
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