Thin film transistor and method of fabricating the same

Active solid-state devices (e.g. – transistors – solid-state diode – Organic semiconductor material

Reexamination Certificate

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Details

C257S009000, C257S014000, C257S024000, C257S327000, C257SE51040, C977S732000, C977S742000, C977S762000

Reexamination Certificate

active

08044391

ABSTRACT:
A thin film transistor includes a multi-coaxial silicon nanowire unit including a plurality of coaxial silicon nanowires on a substrate, the multi-coaxial silicon nanowire unit including a central portion and end portions of the central portion; a gate electrode on the central portion; and a source electrode and a drain electrode on the respective end portions, respectively, so as to electrically connect to the multi-coaxial silicon nanowire unit.

REFERENCES:
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patent: 7439562 (2008-10-01), Auvray et al.
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patent: 1020050001193 (2005-01-01), None
Office Action issued in corresponding Japanese Patent Application No. 2006-104958; mailed May 10, 2010.
Yu, D.P. et al., “Nanoscale Silicon Wires Synthesized Using Simple Physical Evaporation” Applied Physics Letters, vol. 72 No. 26, 3458-3460.
First Notification of Office Action issued in corresponding Chinese Patent Application No. 200610072572.6; issued Mar. 7, 2008.
Office Action issued in corresponding Korean Patent Application No. 10-2005-0029121, mailed Jun. 17, 2011.

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