Semiconductor device manufacturing: process – Having organic semiconductive component
Reexamination Certificate
2011-08-30
2011-08-30
Ho, Tu-Tu V (Department: 2818)
Semiconductor device manufacturing: process
Having organic semiconductive component
C438S197000, C438S216000, C257S040000, C257S288000, C257S410000, C257SE51005, C257SE51007
Reexamination Certificate
active
08008115
ABSTRACT:
The present invention provides a method of manufacturing a thin film transistor of a top-contact structure with suppressed deterioration by a process which is easy and suitable for increase in area without damaging an organic semiconductor pattern. The organic semiconductor pattern is formed on a substrate. An electrode material film is formed on the substrate so as to cover the organic semiconductor pattern. A resist pattern is formed on the electrode material film. By wet etching using the resist pattern as a mask, the electrode material film is patterned. By the process, a source electrode and a drain electrode are formed.
REFERENCES:
patent: 7776662 (2010-08-01), Wang et al.
patent: 2006216718 (2006-08-01), None
Katsuhara Mao
Yoneya Nobuhide
Ho Tu-Tu V
K&L Gates LLP
Sony Corporation
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