Thin film transistor and display using the same

Active solid-state devices (e.g. – transistors – solid-state diode – Non-single crystal – or recrystallized – semiconductor... – Non-single crystal – or recrystallized – material with...

Reexamination Certificate

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C257S059000, C257S079000, C257S316000, C348S030000, C348S450000, C348S486000

Reexamination Certificate

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06903371

ABSTRACT:
An amorphous silicon film is laser irradiated a plural number of times to make the film composed of a plurality of crystal grains while suppressing the formation of protrusions at the boundaries of the adjoining grains to realize a polycrystalline silicon thin film transistor having at least partly therein the clusters of grains, or the aggregates of at least two crystal grains, with preferred orientation in the plane (111), and having high electron mobility of 200 cm2/Vs or above.

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patent: 11-195608 (1999-07-01), None
Kuriyama et al. “Lateral Grain Growth of Poly-Si Films with a Specific Orientation by an Excimer Laser Annealing Method,” Japanese Journal of Applied Physics Dec. 1993, vol. 32, pp. 6190-6195 (1993).
Kuriyama “Excimer laser crystallization of silicon films for AML CDs,” Proceedings of Second International Workshop on Active Matrix Liquid Crystal Displays (AMLCDs '95) Sep. 25-26, 1995 Bethlehem, PA (1995).
Kuriyama et al. “Lateral Grain Growth in the Excimer Laser Crystallization of Poly-Si,” Proceedings of the Materials Research Society Symposium Nov. 1993, vol. 321, pp. 657-662 (1993).

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