Electrical resistors – With base extending along resistance element – Resistance element coated on base
Patent
1994-12-05
1997-10-07
Walberg, Teresa J.
Electrical resistors
With base extending along resistance element
Resistance element coated on base
338312, 29621, 437 60, 437918, H01C 1012, H01L 2700
Patent
active
056753101
ABSTRACT:
A method for fabricating a thin film resistor comprises applying a tantalum nitride layer over a dielectric layer, applying a metallization layer over the tantalum nitride layer, and patterning the metallization layer with a first portion of the metallization layer situated apart from a second portion of the metallization layer and both the first and second portions being at least partially situated on the tantalum nitride layer. In one embodiment, after patterning the metallization layer, the resistance value between the first and second portions of the metallization layer is determined and compared to a predetermined resistance value, and at least one of the first and second portions is trimmed to obtain a modified resistance value between the first and second portions that is closer to the predetermined resistance value than the determined resistance value.
REFERENCES:
patent: 3781610 (1973-12-01), Bodway
patent: 3918019 (1975-11-01), Nunn
patent: 4020222 (1977-04-01), Kausche et al.
patent: 4042479 (1977-08-01), Yamazaki et al.
patent: 4087778 (1978-05-01), Merz et al.
patent: 4200970 (1980-05-01), Schonberger
patent: 4267634 (1981-05-01), Wellard
patent: 4418474 (1983-12-01), Barnett
patent: 4734709 (1988-03-01), Kobayashi et al.
patent: 4780790 (1988-10-01), Takimoto et al.
patent: 4783695 (1988-11-01), Eichelberger et al.
patent: 4801469 (1989-01-01), Norwood
patent: 5043295 (1991-08-01), Ruggerio et al.
patent: 5084420 (1992-01-01), Tsai
patent: 5266529 (1993-11-01), Lau et al.
patent: 5323138 (1994-06-01), Oki et al.
patent: 5353498 (1994-10-01), Fillion et al.
patent: 5420063 (1995-05-01), Maghsoudnia et al.
patent: 5468672 (1995-11-01), Rosvold
patent: 5469131 (1995-11-01), Takahashi et al.
patent: 5496762 (1996-03-01), Sandhu et al.
patent: 5547896 (1996-08-01), Linn et al.
patent: 5586006 (1996-12-01), Seyama et al.
patent: 5602059 (1997-02-01), Horiuchi et al.
U.S. Patent Application "Application of Thin Film Electronic Components on Organic and Inorganic Surfaces" by Robert J. Wojnarowski, et al, filed Dec. 5, 1994.
"Response Surface Methodology", by William G. Hunter, Quality Control Handbook, Section 28, pp. 28-1-28-12.
"Lightly Trimming the Hybrids" by A. Elshabini-Riad, et al, 1993 IEEE, Circuits and Devices, pp. 30-34.
"Electrical Trimming of Ion-Beam-Sputtered Polysilicon Resistors by High Current Pulses" by Soumen Das, et al, IEEE Transactions on Electron Devices, vol. 41, No. 8, Aug. 1994, pp. 1429-1434.
"Improvement of Laser Trimmed Film Resistor Stability By Selection of Optimal Trim Paths" by Jaime Ramfrez-Angulo, et al, IEEE pp. 2188-2191.
"A Technology for High Density Mounting Utilizing Polymeric Multilayer Substrate" by M. Takeuchi, et al, IEEE/CHMT 1989 Japan IEMT Symposium, pp. 136-140.
Gdula Michael
Paik Kyung Wook
Rose James Wilson
Wojnarowski Robert John
Agosti Ann M.
General Electric Company
Snyder Marvin
Valencia Ralphael
Walberg Teresa J.
LandOfFree
Thin film resistors on organic surfaces does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Thin film resistors on organic surfaces, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Thin film resistors on organic surfaces will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2360623