Electrical resistors – Resistance value responsive to a condition – Ambient temperature
Patent
1980-02-29
1983-02-22
Albritton, C. L.
Electrical resistors
Resistance value responsive to a condition
Ambient temperature
338195, 338308, H01C 304
Patent
active
043750567
ABSTRACT:
A thin film resistance thermometer is manufactured to have a predetermined temperature coefficient of resistance while minimizing the amount of metal in the film. The process involves the production of a metal film deposit on an insulating substrate such that the film deposited has a bulk coefficient substantially higher than the desired coefficient with the film being deposited to a thickness that produces the desired coefficient.
REFERENCES:
patent: 3781749 (1973-12-01), Iles et al.
Baxter Ronald D.
Freud Paul J.
Albritton C. L.
Leeds & Northrup Company
MacKay Raymond F.
Miller, Jr. William G.
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