Thin film MOS transistor having pair of gate electrodes opposing

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357 4, 357 2324, H01L 2712, H01L 2701, H01L 2713, H01L 4500

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051403919

ABSTRACT:
A thin film MOS transistor has a construction which can minimize scattering of electron and thus maximize electrons mobility for allowing higher speed operation of the transistor. For this, the MOS transistor has a thin film semiconductor layer having a thickness in a range less than or equal to 100 nm, between a pair of gate electrodes which oppose each other across the semiconductor layer.

REFERENCES:
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patent: 4422090 (1983-12-01), Shepherd et al.
Charles L. Cohen "New FET Design Could Speed the Arrival of 34-D Circuits"Electronics (Sep. 1985) p. 14.
C. Cohen, "3-d IC may auger denses VLSI circuitry; multiple layers are a possibility", Electronics, vol. 56, No. 29 Sep. 22 1983). p. 92.
"An Experimental Study of the Indium Antimonide Thin Film Transistor" Solid State Electronics, vol. 22, No. 1, Jan. 1979, pp. 77-89 Van Calster.
"A Super Thin Transistor in Advanced Poly Si Films", Japanese Journal of Applied Physics, vol. 25, No. 4, Par 2, Apr. 1986, pp. 1291-1293, T. Ohshima.
"New FET Design Could Speed the Arrival of 3-D Circuits", Electronics, vol. 58, No. 36, Sep. 9, 1985, C. L. Cohen.
"Dual-a-Si:H Thin Film Transistors", IEEE Electron Device Letter, vol. EDL-3, No. 12, Dec. 1982, Tuan, et al.

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