Thin film magnetic head having electrical connection to core

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

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324546, 360103, G01R 2726

Patent

active

054020743

ABSTRACT:
In accordance with the present invention, an apparatus and process for convenient electrical access following application of an overcoat layer to the core of a thin film transducer for measuring core-to-coil impedance and breakdown voltage during manufacture and final testing is disclosed. The invention may employ existing process feedback circuitry at the wafer level typically severed in the machining process or the invention provides for a permanent dedicated terminal on the support structure.

REFERENCES:
patent: 4317149 (1982-02-01), Elser et al.
patent: 4457114 (1984-07-01), Hennenfent et al.
patent: 4477968 (1984-10-01), Kracke et al.
patent: 4511942 (1985-04-01), Valstyn
patent: 4559743 (1985-12-01), Kracke et al.
patent: 4739562 (1988-04-01), Kracke et al.
patent: 4800454 (1989-01-01), Schwarz et al.
patent: 4841625 (1989-06-01), Valstyn
IBM Technical Disclosure Bulletin vol. 25 No. 7A Dec. 1982 Hitchner et al.

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