Active solid-state devices (e.g. – transistors – solid-state diode – Non-single crystal – or recrystallized – semiconductor... – Amorphous semiconductor material
Patent
1996-03-18
1998-01-27
Tran, Minh-loan
Active solid-state devices (e.g., transistors, solid-state diode
Non-single crystal, or recrystallized, semiconductor...
Amorphous semiconductor material
257 72, 257294, 349 43, H01L 2904
Patent
active
057124949
ABSTRACT:
A thin film field effect transistor has a hate electrode formed on a glass substrate and a gate insulation film. A channel region, formed of a semiconductor layer, is provided to be opposite to the gate electrode through the gate insulation film, and a pair of source/drain regions, formed of a n-type semiconductor layer, is provided to sandwich the channel region therebetween. An insulation channel protection layer is formed on the channel region. A silicide layer is formed on the source/drain regions, and source/drain electrodes comes in contact therewith. The drain electrode of the source/drain electrodes has an electrode extension portion extending onto the channel protection layer, and being opposite to the channel region through the channel protection layer.
REFERENCES:
patent: 5471330 (1995-11-01), Sarma
patent: 5614731 (1997-03-01), Uchikoga et al.
Akiyama Masahiko
Ikeda Yoshimi
Kiyota Toshiya
Kabushiki Kaisha Toshiba
Tran Minh-Loan
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