Thin-film design for positive and/or negative C-plate

Optical: systems and elements – Light interference – Produced by coating or lamina

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C359S580000

Reexamination Certificate

active

07848020

ABSTRACT:
Thin-film coatings, which for example have alternating layers of high and low refractive index materials, are shown to function as both positive and negative C-plates, in dependence upon the incident radiation. In particular, the shape of the retardance versus angle of incidence profile is found to be determined, at least in part, by the phase thickness of the thin film coating (i.e., the optical thickness in terms of the wavelength of the incident radiation, which may, for example, be expressed in degrees, radians, or as the number of quarter wavelengths). These thin film coatings are optionally integrated into anti-reflection coatings, thin film interference filters and/or other components to improve efficiency and/or functionality.

REFERENCES:
patent: 4312570 (1982-01-01), Southwell
patent: 4536063 (1985-08-01), Southwell
patent: 5196953 (1993-03-01), Yeh et al.
patent: 5912762 (1999-06-01), Li et al.
patent: 6081498 (2000-06-01), Yoo et al.
patent: 6590707 (2003-07-01), Weber
patent: 7035192 (2006-04-01), Kitaoka et al.
patent: 7123416 (2006-10-01), Erdogan et al.
patent: 7170574 (2007-01-01), Tan et al.
patent: 7203001 (2007-04-01), Deng et al.
patent: 2002/0021649 (2002-02-01), Yoo et al.
patent: 2003/0227861 (2003-12-01), Kim et al.
patent: 2004/0032815 (2004-02-01), Kim et al.
patent: 2004/0099972 (2004-05-01), Morris et al.
patent: 2004/0120242 (2004-06-01), Kim et al.
patent: 2004/0141122 (2004-07-01), Nakagawa
patent: 2004/0246871 (2004-12-01), Kim et al.
patent: 2004/0246876 (2004-12-01), Kim et al.
patent: 2005/0057714 (2005-03-01), Jeon et al.
patent: 2005/0128391 (2005-06-01), Tan et al.
patent: 2005/0180292 (2005-08-01), Nagashima
patent: 2005/0213471 (2005-09-01), Taguchi et al.
patent: 2006/0001969 (2006-01-01), Wang et al.
patent: 2006/0028932 (2006-02-01), Nakamura et al.
patent: 2006/0039265 (2006-02-01), Lee
patent: 2006/0083145 (2006-04-01), Yoo et al.
patent: 2006/0126459 (2006-06-01), Moon et al.
patent: 2006/0268207 (2006-11-01), Tan et al.
patent: 2006/0285208 (2006-12-01), Huang
patent: 2007/0053271 (2007-03-01), Ryu et al.
patent: 2007/0070276 (2007-03-01), Tan et al.
patent: 2007/0139771 (2007-06-01), Wang et al.
patent: 2007/0165308 (2007-07-01), Wang et al.
patent: 1542044 (2005-06-01), None
patent: 1726987 (2006-11-01), None
patent: 1783520 (2007-05-01), None
patent: 2005327335 (2005-11-01), None
patent: WO2004/061492 (2004-07-01), None
Laser Focus World Web article: Kim Tan, Karen Hendrix, and Paul McKenzie, “Optical Fabrication: Thin films provide wide-angle correction for waveplate components” Mar. 2007: http://www.laserfocusworld.com/display—article/286513/12/ARTCL
one/Feat/OPT.
Karen Hendrix and K.L. Tan, M. Duelli, D.M. Shemo and M. Tilsch, “Birefringent films for contrast enhancement of LCoS projection systems,” J. Vac. Sci. Technol. A 24(4), pp. 1546-1551, 2006.
L.I. Epstein, “The Design of Optical Filters” J. of the Opt. Soc. of Am., vol. 42, No. 11, Nov. 1952.
Kitagawa et al, “Form birefringence of SiO2/Ta205 periodic multilayers”, Applied Optics, Vo. 24, No. 20, 1985, pp. 3359-3362.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Thin-film design for positive and/or negative C-plate does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Thin-film design for positive and/or negative C-plate, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Thin-film design for positive and/or negative C-plate will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-4162017

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.