Coating processes – Direct application of electrical – magnetic – wave – or... – Pretreatment of substrate or post-treatment of coated substrate
Patent
1991-12-13
1994-04-19
Beck, Shrive
Coating processes
Direct application of electrical, magnetic, wave, or...
Pretreatment of substrate or post-treatment of coated substrate
427535, 427309, 156626, 156643, 156646, B05D 306
Patent
active
053044053
ABSTRACT:
A thin film deposition apparatus has at least two vacuum chambers, one of which is an etching vacuum chamber for cleaning wafer surfaces. The etching vacuum chamber includes a first gas introduction system for introducing an etching gas, and a second gas introduction system for introducing a reactive gas for use in the cleaning whereby silicon deposited films will be removed. A thin film deposition method which may be carried out by the apparatus includes a cleaning process performed in advance of thin film deposition process for depositing a thin film on the wafer surfaces. In the cleaning process, the wafer surfaces are etched with the etching gas, the wafers are thereafter taken out of the chamber, a simulation wafer for particle checking is transferred into the chamber, and the degree to which particles have been generated is checked with the simulation wafer. When required, the reactive gas is introduced thereafter to gasify the deposited films and the particles. The resultant gas is evacuated to the outside of the vacuum chamber.
REFERENCES:
patent: 4579609 (1986-04-01), Reif et al.
patent: 4877757 (1989-10-01), York et al.
patent: 4928537 (1990-05-01), Liu et al.
patent: 5015330 (1991-05-01), Okumura et al.
Kobayashi Masahiko
Numajiri Kenji
Anelva Corporation
Beck Shrive
Maiorana David M.
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