Thin film analyzer

Details Thin film analyzer Thin film analyzer

2005-06-07

2005-06-07

Porta, David (Department: 2878)

Radiant energy

Invisible radiant energy responsive electric signalling

Infrared responsive

Reexamination Certificate

active

06903340

ABSTRACT:
A thin film analyzer capable of static and dynamic measurements is disclosed. The apparatus collects and analyzes spectral reflectance data as a function of time. It is especially useful for measuring the changing thickness of a transparent, organic thin film as it is dissolved by a solvent. The measurements can be made with small quantities of solvent, on the order of one milliliter, in small, localized areas on a coated substrate, thereby allowing multiple, independent measurements on each substrate with minimal consumption of solvent.

REFERENCES:
patent: 4203799 (1980-05-01), Sugawara et al.
patent: 4647172 (1987-03-01), Batchelder et al.
patent: 4823009 (1989-04-01), Biemann et al.
patent: 4998021 (1991-03-01), Mimasaka
patent: 5304813 (1994-04-01), De Man
patent: 5427878 (1995-06-01), Corliss
patent: 5452953 (1995-09-01), Ledger
patent: 5764352 (1998-06-01), Kappel et al.
patent: 5982166 (1999-11-01), Mautz
patent: 6271047 (2001-08-01), Ushio et al.
patent: 6275297 (2001-08-01), Zalicki

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