Thickness standard sample and method of calibrating gage

Details Thickness standard sample and method of calibrating gage Thickness standard sample and method of calibrating gage

1977-04-14

1979-04-17

Smith, Alfred E.

Radiant energy

Calibration or standardization methods

250272, 428344, G01N 2322

Patent

active

041502884

ABSTRACT:
A thickness standard sample consisting of a base plate and an even thick foil fixed on the base plate. The foil has a uniform standard thickness for calibrating an X-ray fluorescence thickness gauge or the like. The sample is very inexpensive and serves as an excellent uniform thickness standard sample so that an operator may set any point on the sample surface to the calibrating gauge axis.

REFERENCES:
patent: 473790 (1892-04-01), Sichel
patent: 2106133 (1938-01-01), Goldman et al.
patent: 2654684 (1953-10-01), Heikin
patent: 2804416 (1957-08-01), Phillipsen
patent: 3938125 (1976-02-01), Benassi

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