Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1990-08-15
1992-08-11
Wieder, Kenneth A.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324674, G01R 2726
Patent
active
051382687
ABSTRACT:
A device and method for detecting the thickness of an essentially nonconducting material during movement of the material within the dielectric between the plates of a capacitance detection probe is disclosed. The detection probe is electrically coupled to a material thickness analysis system containing an oscillator with an output frequency that is a related to the dielectric between the plates. Storage and analysis of output frequencies for the oscillator with and without the nonconducting material between the plates generates material thickness information.
REFERENCES:
patent: 3039051 (1962-06-01), Locher
patent: 3221171 (1965-11-01), Locher
patent: 3341774 (1967-09-01), Dyben
patent: 3471780 (1969-10-01), Beddows
patent: 3519922 (1970-07-01), Nash et al.
patent: 3523246 (1970-08-01), Hall et al.
patent: 3761810 (1973-09-01), Fathauer
patent: 4006411 (1977-02-01), Akagawa et al.
patent: 4063167 (1977-12-01), Duly
patent: 4071820 (1978-01-01), Mushinsky
patent: 4086528 (1978-04-01), Walton
patent: 4130796 (1978-12-01), Shum
patent: 4208625 (1980-06-01), Piso
patent: 4284947 (1981-08-01), Walton
patent: 4311958 (1982-01-01), Aeppli
patent: 4370611 (1983-01-01), Gregory et al.
patent: 4433286 (1984-02-01), Capots et al.
patent: 4630224 (1986-12-01), Sollman
patent: 4706014 (1987-11-01), Fabbri
patent: 4710701 (1987-12-01), Strentz
patent: 4849686 (1989-07-01), Lyyra
patent: 4864512 (1989-09-01), Coulson et al.
patent: 4868507 (1989-09-01), Reed
Corriea Pat
Killian Ed
Lowry Gordon
Mulkey Steve
Regan Maura K.
Ritchey James M.
Wieder Kenneth A.
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