Thickness measurement

Details Thickness measurement Thickness measurement

1975-02-18

1977-10-11

McGraw, Vincent P.

Optics: measuring and testing

Angle measuring or angular axial alignment

With photodetection remote from measured angle

250561, 356199, 356209, G01B 1100, G01N 2148

Patent

active

040532348

ABSTRACT:
For detecting changes of level of a moving surface, a sharply defined light pattern is directed on to the surface and an image of the pattern is formed on a multiple photodiode strip so that a predetermined point of reference of the image is variably located on the strip depending on variation in level of the surface, the photodiode strip is repetitively scanned to create a voltage waveform repetitively defining the variable position of the point of reference on the image in relation to the fixed position of a point of reference on the photodiode strip, and the waveform is analysed to determine the variations in level of the moving surface.

REFERENCES:
patent: 3187185 (1965-06-01), Milnes
patent: 3565531 (1971-02-01), Kane et al.
patent: 3667846 (1972-06-01), Nater et al.
patent: 3728715 (1973-04-01), Shapiro
patent: 3741656 (1973-06-01), Shapiro
patent: 3782833 (1974-01-01), Biggs et al.
patent: 3834819 (1974-09-01), Montone

Affiliated with

Also associated with

Rating

Thickness measurement does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Thickness measurement, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Thickness measurement will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-736641