Thickness gauging of single-layer conductive materials with two-

Details Thickness gauging of single-layer conductive materials with two- Thickness gauging of single-layer conductive materials with two-

1997-05-08

1998-12-08

Patidar, Jay M.

Electricity: measuring and testing

Magnetic

With means to create magnetic field to test material

324202, 324230, 324240, 324241, G01B 706, G01R 3312

Patent

active

058475621

ABSTRACT:
A thickness gauging instrument uses a flux focusing eddy current probe and two-point nonlinear calibration algorithm. The instrument is small and portable due to the simple interpretation and operational characteristics of the probe. A nonlinear interpolation scheme incorporated into the instrument enables a user to make highly accurate thickness measurements over a fairly wide calibration range from a single side of nonferromagnetic conductive metals. The instrument is very easy to use and can be calibrated quickly.

REFERENCES:
patent: 5617024 (1997-04-01), Simpson et al.

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