Thickness/density mesuring apparatus

Details Thickness/density mesuring apparatus Thickness/density mesuring apparatus

1989-04-21

1992-03-24

LaRoche, Eugene R.

X-ray or gamma ray systems or devices

Specific application

Absorption

378 56, 25037014, G01B 1502, G01N 2306, G01T 122, G01T 124

Patent

active

050995049

ABSTRACT:
A low-voltage, compact measuring apparatus for measuring any one of thickness, density and denier of a material is disclosed which uses a PIN diode in conjunction with a low noise processing circuit to detect particle radiation emitted from a source, which source has its detection intensity affected by a material to be measured. A light blocking, particle radiation permeable material protects the PIN diode from detecting light radiation. A system for controlling the extrusion of a film using the measuring apparatus, and for correcting for erroneous measurement caused by web flutter, are also disclosed.

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