Electrical resistors – Resistance value responsive to a condition – Photoconductive
Patent
1982-07-19
1984-11-13
Envall, Jr., Roy N.
Electrical resistors
Resistance value responsive to a condition
Photoconductive
338 17, 250211J, H01L 3108
Patent
active
044828810
ABSTRACT:
A semiconductor photoconductor having low impedance nonmetallic contacts is disclosed which has increased detectivity over prior art photoconductor structures. The improved photoconductor has metallic contacts that are separated by a contact length that is greater than the optical length of the detector. The contact regions of the semiconductor adjacent the detector region are thicker than the detector region. The process for fabricating the photoconductor includes thinning the detector region to an appropriate thickness while preserving the greater thickness of the contact regions.
REFERENCES:
patent: 3523188 (1970-08-01), Kazan et al.
patent: 3968360 (1976-07-01), Monnier
patent: 3988612 (1976-10-01), Palmer
patent: 4025793 (1977-05-01), Shaw et al.
patent: 4307372 (1981-12-01), Matsui et al.
Kinch et al., "Geometrical Enhancement of HgCdTe Photoconductive Detectors", Infrared Physics, 1977, vol. 17, pp. 137-145.
Fote Alfred A.
Schoolar Richard B.
Envall Jr. Roy N.
Sears C. N.
Taylor Ronald L.
The Aerospace Corporation
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