Thermometry probe calibration method

Thermal measuring and testing – Temperature measurement – By electrical or magnetic heat sensor

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C374S001000, C374S172000, C702S099000, C600S549000

Reexamination Certificate

active

11248492

ABSTRACT:
A method in which thermal mass and manufacturing differences are compensated for in thermometry probes by storing characteristic data relating to individual probes into an EEPROM for each probe which is used by the temperature apparatus.

REFERENCES:
patent: 3491596 (1970-01-01), Dean
patent: 3592059 (1971-07-01), Chilton
patent: 3681991 (1972-08-01), Eberly, Jr.
patent: 3729998 (1973-05-01), Mueller et al.
patent: 3791214 (1974-02-01), Keith
patent: 3832669 (1974-08-01), Mueller et al.
patent: 3832726 (1974-08-01), Finelli
patent: 3832902 (1974-09-01), Usami et al.
patent: 3878724 (1975-04-01), Allen
patent: 3893058 (1975-07-01), Keith
patent: 3915003 (1975-10-01), Adams
patent: 4158965 (1979-06-01), Prosky
patent: 4183248 (1980-01-01), West
patent: 4204429 (1980-05-01), Shimazaki et al.
patent: 4210024 (1980-07-01), Ishiwatari et al.
patent: 4411535 (1983-10-01), Schwarzschild
patent: 4464725 (1984-08-01), Briefer
patent: 4466749 (1984-08-01), Cunningham et al.
patent: 4475823 (1984-10-01), Stone
patent: 4480312 (1984-10-01), Wingate
patent: 4487208 (1984-12-01), Kamens
patent: 4688949 (1987-08-01), Hatakenaka
patent: 4713783 (1987-12-01), Fletcher
patent: H562 (1988-12-01), Trachier et al.
patent: 4790324 (1988-12-01), O'Hara et al.
patent: 4901257 (1990-02-01), Chang et al.
patent: 4932789 (1990-06-01), Egawa et al.
patent: RE34507 (1994-01-01), Egawa et al.
patent: 5293877 (1994-03-01), O'Hara
patent: 5463375 (1995-10-01), Bauer
patent: 5542285 (1996-08-01), Merilainen et al.
patent: 5720293 (1998-02-01), Quinn et al.
patent: 5735605 (1998-04-01), Blalock
patent: 5857777 (1999-01-01), Schuh
patent: 5967992 (1999-10-01), Canfield
patent: 6000846 (1999-12-01), Gregory et al.
patent: 6036361 (2000-03-01), Gregory et al.
patent: 6109784 (2000-08-01), Weiss
patent: 6146015 (2000-11-01), Weiss
patent: 6188971 (2001-02-01), Kelly
patent: 6250802 (2001-06-01), Dotan
patent: 6280397 (2001-08-01), Yarden et al.
patent: 6304827 (2001-10-01), Blixhavn et al.
patent: 6355916 (2002-03-01), Siefert
patent: 6374191 (2002-04-01), Tsuchiya et al.
patent: 6454931 (2002-09-01), Patrick et al.
patent: 6485433 (2002-11-01), Peng
patent: 6634789 (2003-10-01), Babkes
patent: 6698921 (2004-03-01), Siefert
patent: 2005/0018749 (2005-01-01), Sato et al.
patent: 2005/0069925 (2005-03-01), Ford et al.
patent: 2 140 923 (1984-12-01), None
patent: 54025882 (1979-02-01), None
patent: 59184829 (1984-10-01), None
patent: 61296224 (1986-12-01), None
patent: 61296225 (1986-12-01), None
patent: 61296226 (1986-12-01), None
patent: 62069128 (1987-03-01), None
patent: 01189526 (1989-07-01), None
patent: 92/03705 (1992-03-01), None
The Dynamic Thermometer: An Instrument For Fast Measurements With Platinum Resistance Thermometers: Transactions of the Institute of Measurement and Control; vol. 15, No. 1; 1993; 4 pages (pp. 11-18).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Thermometry probe calibration method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Thermometry probe calibration method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Thermometry probe calibration method will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3900156

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.