Thermally compensated reference interferometer and method

Details Thermally compensated reference interferometer and method Thermally compensated reference interferometer and method

1989-02-27

1990-01-02

McGraw, Vincent P.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

372 32, G01B 902

Patent

active

048909220

ABSTRACT:
A first birefringent material is positioned to receive an optical signal output from an optical source. A second birefringent material is positioned to receive the signal transmitted through the first birefringent material. The birefringence of the first birefringent material is modulated to produce a modulation in the phase difference between two polarizations propagated between the birefringent materials. A detector forms an electrical signal indicative of the phase shift produced by the first and second birefringent materials between a pair of orthogonal polarizations in the optical signal received by the first birefringent material. This phase shift is opposite to phase shifts caused by changes in the source wavelength. A feedback signal indicative of the hase shift caused by the crystals is fed back to the optical source to stabilize its frequency. The system produces a temperature-independent phase shift between the two polarizations by means of proper selection of the lengths of the crystals in the optical path.

REFERENCES:
patent: 4299490 (1981-11-01), Cahill et al.
patent: 4305046 (1981-12-01), Le Floch et al.
patent: 4410275 (1983-10-01), Shaw et al.
Temperature Compensation of Birefringent Optical Filters, Kimura et al., IEEE Proceedings, 8-1971, pp. 1273-1274.

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