Thermal measuring and testing – Thermal testing of a nonthermal quantity
Patent
1986-02-10
1989-10-17
Yasich, Daniel M.
Thermal measuring and testing
Thermal testing of a nonthermal quantity
250334, 356128, 374124, 374128, G01N 2100, G01N 2500
Patent
active
048742511
ABSTRACT:
A thermal wave imaging apparatus generates a real time image of the surface and subsurface of an opaque solid object. A.C. electrical signals indicative of the configuration of the surface and subsurface of the object which are generated during a thermal wave scan of the object by a first heating beam which generates a localized temperature gradient on the object and a deflectable second probe beam heating beam, which deflection is detected by a detection device mounted adjacent to the object, are stored in an image memory under the control of a central processor. A refresh counter generates sequential, incremental signals used to control the X and Y axis deflection of a display monitor. Such signals also address the image memory and generate output data controlling the intensity of the display point at each generated X and Y axis deflection point. A modulation and intensity regulation circuit generates an optical beam having a constant amplitude in spite of any fluctuations in the output of the heating laser.
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Favro Lawrence D.
Kuo Pao-Kuang
Thomas Robert L.
Black Gerald R.
Wayne State University
Weintraub Arnold S.
Yasich Daniel M.
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