Thermal transfer measurement of an integrated circuit

Details Thermal transfer measurement of an integrated circuit Thermal transfer measurement of an integrated circuit

2006-01-10

2006-01-10

Verbitsky, Gail (Department: 2859)

Thermal measuring and testing

Determination of inherent thermal property

C374S178000

Reexamination Certificate

active

06984064

ABSTRACT:
A system and method may be utilized to thermally characterize a live integrated circuit device. The system and method can determine the thermal transfer function of the device by analyzing environment temperature, and the temperature of the integrated circuit die over a time period. The time period can be between the removal of power to the device and a time when a thermal equilibrium is reached or between other changes in power parameters provided to the device. The thermal characteristics can be utilized in a feed forward algorithm for controlling temperature of the integrated circuit device and to determine interface integrity.

REFERENCES:
patent: 3253221 (1966-05-01), Peckover
patent: 4001649 (1977-01-01), Young
patent: 4284872 (1981-08-01), Graeme
patent: 4734641 (1988-03-01), Byrd, Jr. et al.
patent: 5302022 (1994-04-01), Huang et al.
patent: 5477076 (1995-12-01), Gay et al.
patent: 5927853 (1999-07-01), Christiaens et al.
patent: 6132083 (2000-10-01), Enala
patent: 6238086 (2001-05-01), Mikubo et al.
patent: 6321175 (2001-11-01), Nagaraj
patent: 6491426 (2002-12-01), Schonath et al.
patent: 6679628 (2004-01-01), Breinlinger
patent: 2001/0021217 (2001-09-01), Gunther et al.
patent: 3832273 (1990-03-01), None

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