Thermal measuring and testing – Thermal testing of a nonthermal quantity – Of susceptibility to thermally induced deteriouration – flaw,...
Patent
1994-07-20
1997-03-25
Cuchlinski, Jr., William A.
Thermal measuring and testing
Thermal testing of a nonthermal quantity
Of susceptibility to thermally induced deteriouration, flaw,...
738656, 165 61, F25B 2900, G01N 360
Patent
active
056137761
ABSTRACT:
A thermal shock insert or adaptor is used with an environmental chamber to provide a facility for conducting thermal shock testing. The thermal shock adaptor has a cabinet defining an interior specimen chamber. A chamber opening is provided through the cabinet and a specimen platform which is movable relative to the cabinet is provided to receive and support a test specimen and to move the specimen through the chamber opening, between a first position in which the specimen is contained within the specimen chamber and a second position in which the specimen is contained within the environmental chamber with which the thermal shock adaptor is used. The thermal shock adaptor is also provided with a high temperature plenum, heating coils, and a high temperature controller, all operatively connected with the specimen chamber to maintain the specimen chamber at a selected temperature in accordance with predetermined specifications.
REFERENCES:
patent: 4854726 (1989-08-01), Lesley et al.
patent: 5147136 (1992-09-01), Hartley et al.
patent: 5167451 (1992-12-01), Muller et al.
patent: 5294199 (1994-03-01), Boersen et al.
Instruction Manual for Thermotron Environmental Chamber, Model F-32-CHV-705-705.
Thermotron "Electrodynamic Vibration Testing Systems," brochure Number Form 4178.
Thermotron "Environmental Simulation Equipment and Systems," brochure Number Form T10-043-381.
Thermotron "General Catalog," Number T14-047.
Barnes Russell N.
Turner Robert M.
Cuchlinski Jr. William A.
Environmental Screening Technology, Inc.
Hirshfeld Andrew
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