Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Patent
1997-12-12
1999-12-21
Assouad, Patrick
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
374134, 374137, 713300, G01K 1700
Patent
active
060061685
ABSTRACT:
A technique for implementing a programmable thermal model of an integrated circuit component such as a central processing unit (CPU) and its associated heat sink. The model estimates the die temperature of the component as if there were no cooling devices present in the system such as a forced air cooling fan by integrating the thermal energy added when the component is active and by integrating the thermal energy removed when it is idle. A programmable power value may be used to represent the heat added to the model at each model sample period. The effect of a heat sink in cooling the idle component may be modeled by reducing the value of the heat accumulator by a predetermined fractional amount during each sample period. The decay time constant for the model may be changed by then adjusting the sample period. With an accurate model estimate predicting the component temperature in the absence of cooling being instantaneously available, any associated cooling device such as a fan can be operated in such a manner as to turn on only when it is estimated to actually be needed and to be kept off at all other times. In addition, a turn off delay can be implemented in order to avoid undesirable cycling effects.
REFERENCES:
Thomas et al., "Temperature Estimation of Semiconductor Die Heating Using Numerical Techniques in Real Time", IEE, Jan. 29, 1997.
Fitch et al., "Thermap: A Thermal Model for Microprocessors", IEEE, Sep. 1995.
Rosten et al., "Thermal Modeling of the Pentium Processor Package", IEEE, 1994.
Hazen Michael E.
Schumann Reinhard C.
Smith Arnold J.
Assouad Patrick
Digital Equipment Corporation
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