Boots – shoes – and leggings
Patent
1988-12-22
1991-06-04
Lall, Parshotam S.
Boots, shoes, and leggings
374178, G01K 500, G01K 1100
Patent
active
050219812
ABSTRACT:
A method for determining the thermal history of an object is disclosed. The object carries at least two thermal calibration materials having different activation energies. The method comprises: first, exposing an object to a thermal treatment; second, detecting the change in each of the calibration materials caused by the thermal treatment; and third, determining the thermal history of the thermal treatment from the detected changes.
Also disclosed are thermal history recording devices comprising one or more metal insulator semiconductor (MIS) capacitors. The insulating layer is non-uniformly doped with mobile charged carriers. Two or more MIS capacitors, each having different activation energies, may be mounted in a common support structure to provide a thermal memory cell. The thermal cells may be used in conjunction with an apparatus for determining the thermal history of the cells as also disclosed herein.
REFERENCES:
patent: 2809116 (1957-10-01), Laskowski
patent: 3038812 (1962-06-01), Berman et al.
patent: 3102425 (1963-09-01), Westman et al.
patent: 3344670 (1967-10-01), Olsen et al.
patent: 3456112 (1969-07-01), Webb
patent: 3479876 (1969-11-01), Kliewer
patent: 3496774 (1970-02-01), Preszler
patent: 3543582 (1970-12-01), Sessler
patent: 3638495 (1972-02-01), Sessler
patent: 3759104 (1973-09-01), Robinson
patent: 3888631 (1975-06-01), Sturzinger
patent: 3965741 (1976-06-01), Wachtell et al.
patent: 3977945 (1976-08-01), Tornmarck
patent: 4022149 (1977-05-01), Berger
patent: 4114559 (1978-09-01), Rogen
patent: 4177620 (1979-12-01), Daly et al.
patent: 4189399 (1980-02-01), Patel
patent: 4195056 (1980-03-01), Patel
patent: 4195058 (1980-03-01), Patel
patent: 4208186 (1980-06-01), Patel
patent: 4215208 (1980-07-01), Yee et al.
patent: 4228126 (1980-10-01), Patel et al.
patent: 4238352 (1980-12-01), Patel
patent: 4276190 (1981-06-01), Patel
patent: 4277974 (1981-07-01), Karr et al.
patent: 4278561 (1981-07-01), Yee
patent: 4298348 (1981-11-01), Ivory
patent: 4328259 (1982-05-01), Patel et al.
patent: 4339240 (1982-07-01), Patel
patent: 4373032 (1983-02-01), Preziosi et al.
patent: 4382700 (1983-05-01), Youngren
patent: 4384980 (1983-05-01), Patel
patent: 4388332 (1983-06-01), Egee et al.
patent: 4432656 (1984-02-01), Allmendinger
patent: 4439346 (1984-03-01), Patel et al.
patent: 4452995 (1984-06-01), Patel
patent: 4469452 (1984-09-01), Sharpless et al.
patent: 4533898 (1985-08-01), Sauermann
patent: 4546373 (1985-10-01), Todd et al.
patent: 4591566 (1986-05-01), Smith
patent: 4629330 (1986-12-01), Nichols
patent: 4636093 (1987-01-01), Nagasaka et al.
patent: 4646674 (1987-03-01), Preziosi et al.
patent: 4735745 (1988-04-01), Preziosi et al.
patent: 4737463 (1988-04-01), Bhattacharjee et al.
patent: 4744672 (1988-05-01), Tursky et al.
Sze, S. M. "Semiconductor Devices, Physics and Technology", .COPYRGT.,1985, pp. 186-187, 197-200, 471-472.
Investigations of Thermally Oxidised Silicon Surfaces Using Metal-Oxide-Semiconductor Structures, Grove, A. S. et al., Solid-State Electronics, vol. 8, pp. 145-163, 1964.
Stabilization of SiO.sub.2 Passivation Layers with P.sub.2 O.sub.5, Kerr, D. R. et al., IBM Journal, pp. 376-384, Sep., 1964.
Ion Transport Phenomena in Insulating Films, Snow, E. H. et al., Journal of Applied Physics, vol. 36, No. 5, pp. 1664-1673, May, 1965.
Sodium Distribution in Thermal Oxide on Silicon by Radiochemical and MOS Analysis, Yon, E. et al., IEEE Transactions on Electron Devices, vol. ED-13, No. 12, pp. 276-280, Feb., 1966.
Temperature Indicators, Temperature Integrators, Temperature Function Integrators and The Food Spoilage Chain, Olley, J., pp. 125-132.
TL Series Non-Reversible Temperature Indicators, Omega Catalog, pp. Q3-Q14.
Time-Temperature Indicating System "Writes Status" of Product Shelf Life, Hu, K. H., Food Technology, pp. 56-62, Aug., 1972.
Defrost Indicators, Schoen, H. M. et al., Food Technology, pp. 46-50, Oct., 1972.
Temperature Indicators--The State of the Art, Byrne, C. H., Food Technology, pp. 66-68, Jun., 1976.
Testing of Time-Temperature Indicating and Defrost Devices, Kramer, A. et al., Food Technology, pp. 50-56, Feb., 1976.
Identification of Alkali Metal Ions in Silicon Dioxide Films, Antyushin, V. F. et al., Physica Status Solidi (a) 56, pp. K91-K95, 1979.
Arrhenius Kinetics as Applied to Product Constituent Losses in Ultra High Temperature Processing, Swartzel, K. R., Journal of Food Science, vol. 47, 1982.
Auger sputter Profiling and Secondary Ion Mass Spectrometry Studies of SiO.sub.2 Grown in O.sub.2 /HCI Mixtures, Rouse, J. W. et al., J. Electrochem. Soc.: Solid-State Science and Technology, vol. 131, No. 4, pp. 887-894, Apr., 1984.
Continuous Flow Apparatus For Kinetic Studies, Swartzel, K. R. et al., Summer Meeting American Society of Agricultural Engineers, Paper No. 84-6006, Jun., 1984.
Diffusivity of Implanted Chlorine Atoms in Thermal Oxides on Silicon, Vengurlekar, A. S. et al., J. Electrochem. Soc.: Solid-State Science and Technology, vol. 132, No. 5, pp. 1172-1177, May, 1985.
System Design and Calibration of a Continuous Flow Apparatus for Kinetic Studies, Swartzel, K. R. et al., Journal of Food Science, vol. 50, pp. 1203-1207, 1985.
Micro-Computer Program for Determining the Unique Time-Temperature Associated With the Equivalent Point Method of Thermal Evaluation.sup.1, Sadeghi, F. et al., pp. 331-335, 1986.
Calibration Materials for Thermal Systems, Sadeghi, F. et al., Paper No. 423, Jun., 1986.
Mobile Ions in SiO.sub.2 Layers on Si, Hillen, M. W. et al., Instabilities in Silicon Devices: Silicon Passivation and Related Instabilities, Barbottin, G. et al., Chap. 8, pp. 403-439, 1986.
Ganesan Sudalaimuthu G.
Hamaker Raymond W.
Kuehn Richard T.
Sadeghi Farid
Swartzel Kenneth R.
Lall Parshotam S.
Melnick S. A.
North Carolina State University
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