Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2005-08-09
2005-08-09
Bui, Bryan (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
C702S132000, C374S141000, C165S011100, C257S717000
Reexamination Certificate
active
06928380
ABSTRACT:
A system and method for measuring thermal distributions of an electronic device during operation is disclosed. The system includes an electronic device, a heat sink adjacent to the electronic device and an electrical-insulating layer disposed on the electronic device so as to separate the electronic device and the heat sink. The system further includes a plurality of thermal sensors located on the electrical-insulating layer, each of the plurality of thermal sensors in a different location. The plurality of thermal sensors is located within one or more thin film circuit layers disposed adjacent to the electrical insulating layer. The system further includes a module for receiving thermal information from the plurality of thermal sensors during operation of the electronic device. The system further includes a processor coupled to the module for generating a thermal distribution of the electronic device based on the thermal information received from the plurality of thermal sensors.
REFERENCES:
patent: 4899180 (1990-02-01), Elhatem et al.
patent: 4980702 (1990-12-01), Kneezel et al.
patent: 5036337 (1991-07-01), Rezanka
patent: 5075690 (1991-12-01), Kneezel
patent: 5825625 (1998-10-01), Esterberg et al.
patent: 6020820 (2000-02-01), Chiang
patent: 6058012 (2000-05-01), Cooper et al.
patent: 6092926 (2000-07-01), Still et al.
patent: 6496118 (2002-12-01), Smith
patent: 6515285 (2003-02-01), Marshall et al.
patent: 6631638 (2003-10-01), James et al.
patent: 6787870 (2004-09-01), Wienand et al.
patent: WO 3046702 (2003-06-01), None
Chey S. Jay
Hamann Hendrik
Lacey James A.
Vichiconti James
von Gutfeld Robert J.
Bui Bryan
Dougherty Anthony T.
Fleit Kain Gibbons Gutman Bongini & Bianco P.L.
Gibbons Jon A.
International Business Machines - Corporation
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