Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2007-01-26
2009-02-10
Le, John H (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
C307S651000, C702S130000
Reexamination Certificate
active
07490018
ABSTRACT:
A thermal management system according to an embodiment of the present invention includes first and second thermo sensors embedded in a chip, a trimming control circuit which determines a characteristic of the first thermo sensor based on a trimming value, a nonvolatile memory which stores trimming data relating the characteristic of the first thermo sensor in an initial state and a system controller which provides temperature data to the trimming control circuit, wherein the temperature data relates a chip temperature detected by the second thermo sensor, wherein the trimming control circuit updates the trimming value based on the temperature data and the trimming data.
REFERENCES:
patent: 6674185 (2004-01-01), Mizuta
patent: 6934658 (2005-08-01), Clabes et al.
patent: 7340366 (2008-03-01), Aas et al.
patent: 2003-149055 (2003-05-01), None
Inukai Takashi
Urakawa Yukihiro
Kabushiki Kaisha Toshiba
Le John H
Sprinkle IP Law Group
LandOfFree
Thermal management system does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Thermal management system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Thermal management system will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4059134