Measuring and testing – Gas analysis – With compensation detail
Patent
1997-03-10
1998-04-28
Williams, Hezron E.
Measuring and testing
Gas analysis
With compensation detail
73 2501, 62405, 62383, 62451, 62268, 374 33, 165 29, 165 32, G01N 3108, F25D 2306
Patent
active
057446962
ABSTRACT:
Sample analysis in a portable analytical instrument, preferably in the form of a gas chromatograph, benefits from temperature control of one or more thermal zones in the instrument by way of a thermal isolation system that includes a novel pumping assembly to effect a selective amount of thermal isolation of the thermal zone. The pumping assembly includes a pumping element in the form of a tubular or planar palladium structure. The pumping assembly makes use of the unique properties of palladium to allow selective control of a nominal gas pressure within a vacuum cavity. A component system, which may include a separation column and a thermal device for heating and/or cooling the component system, may be provided within the vacuum cavity. The thermal device and the pumping assembly are individually controlled by a control system. The pumping assembly may be operated to allow selective control of the thermal isolation of the thermal zone; alternatively, the component system may be subject to a controlled temperature by operating the thermal device. A sample mixture passing through the separation column may thereby be exposed to a desired temperature profile according to a selected program so that the sample will separate into its components for subsequent detection by a detector.
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Baker James Ward
Berger Terry A.
Wang Tak Kui
Dudley Mark Z.
Hewlett--Packard Company
Wiggins J. David
Williams Hezron E.
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