Thermal interface material with support structure

Semiconductor device manufacturing: process – Packaging or treatment of packaged semiconductor – Assembly of plural semiconductive substrates each possessing...

Reexamination Certificate

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C438S121000, C438S106000, C438S125000

Reexamination Certificate

active

08034662

ABSTRACT:
Various semiconductor chip thermal interface material methods and apparatus are disclosed. In one aspect, a method of establishing thermal contact between a first semiconductor chip and a heat spreader is provided. The method includes placing a thermal interface material layer containing a support structure on the first semiconductor chip. The heat spreader is positioned proximate the thermal interface material layer. The thermal interface material layer is reflowed to establish thermal contact with both the first semiconductor chip and the heat spreader.

REFERENCES:
patent: 5940687 (1999-08-01), Davis et al.
patent: 6043110 (2000-03-01), Davis et al.
patent: 7750455 (2010-07-01), Pagaila et al.
patent: 2007/0141378 (2007-06-01), Pacheco et al.
patent: 2008/0093733 (2008-04-01), Hsu
patent: 2345577 (2000-07-01), None
patent: WO2005053021 (2005-06-01), None
Arthur Keigler et al.;Copper Deposition for Pillars and Vias; Semiconductor Manufacturing Magazine; vol. 7, Issue 8; Aug. 2006; pp. 1-6.
PCT/US2010/024589 International Search Report.

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