Thermal imaging system and method

Radiant energy – Infrared-to-visible imaging – Including liquid crystal detector

Reexamination Certificate

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C374S121000, C374S133000

Reexamination Certificate

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07119334

ABSTRACT:
Systems and methods for thermal sensing and imaging using the electro-optic effect. A thermal detection system comprises a temperature sensing element that includes an electro-optic (EO) material layer having a length axis and characterized by a temperature dependent index of refraction, an electrical mechanism for inducing a chance in the index of refraction, a laser beam propagating lengthwise through EO layer for probing the refraction index change, and a light intensity meter for measuring a laser beam intensity change caused by the temperature dependent refraction index change. Thermal imaging is obtained by using a pixel array of such thermal sensing elements. The intensity reading may be done in either a cross-polarizer or a Mach Zehnder Interferometry reading configuration.

REFERENCES:
patent: 4002902 (1977-01-01), Donjon et al.
patent: 4594507 (1986-06-01), Elliott et al.
patent: 4688900 (1987-08-01), Doane et al.
patent: 4758060 (1988-07-01), Jaeger et al.
patent: 4959546 (1990-09-01), Bly
patent: 5021663 (1991-06-01), Hornbeck
patent: 5559332 (1996-09-01), Meissner et al.
patent: 5792377 (1998-08-01), Belcher et al.
patent: 6238085 (2001-05-01), Higashi et al.
patent: 6245591 (2001-06-01), Beratan et al.
patent: 6791610 (2004-09-01), Butler et al.
“Handbook of Optics—Fundamentals Techniques and Design”, Michael Bass, Eric W. Van Stryland, David R. Williams, William L. Wolfe (Editors), McGraw Hill 1995, (2ndedition), vol. 1 Chapters 15-19.
“Un-cooled Thermal Imaging: Arrays Systems, and Applications” by Paul W. Kruse, SPIE, 2001.
“Introduction to Photorefractive Nonlinear Optics”, by Pochi Yeh, Wiley& Sons, USA, 1993, pp. 26-29.

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