Thermal measuring and testing – Temperature measurement – In spaced noncontact relationship to specimen
Reexamination Certificate
2004-06-30
2009-02-03
Verbitsky, Gail (Department: 2855)
Thermal measuring and testing
Temperature measurement
In spaced noncontact relationship to specimen
C374S133000, C374S121000, C250S338100, C356S043000
Reexamination Certificate
active
07484885
ABSTRACT:
A thermal imaging apparatus comprises a housing defining an entrance pupil for ingress of imaging radiation. At least one light sensor is positioned forward of the entrance pupil. An electronic imaging device such as a focal plane array is located in the housing rearward of the entrance pupil for converting imaging radiation to electrical signals for further processing. The apparatus further includes a shutter having an open position and a closed position. In the closed position, the shutter is located between the entrance pupil and the electronic imaging device so as to inhibit exposure of the electronic imaging device to incident radiation. Circuitry is provided for selectively operating the shutter to be in the closed position based on signals produced at the light sensor.
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Manual entitled “ThermoView Ti30 High Performance Thermal Imager for Predictive Maintenance,” bearing a copyright date of 2003.
Carlson Paul S.
Heinke Thomas
Nelson Mullins Riley & Scarborough LLP
Raytek Corporation
Verbitsky Gail
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