Thermal fatigue testing using plural test trips with graduated s

Details Thermal fatigue testing using plural test trips with graduated s Thermal fatigue testing using plural test trips with graduated s

1992-11-09

1996-06-18

Wieder, Kenneth A.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

For fault location

324555, 374 56, 374187, 73767, 73774, G01B 716

Patent

active

055281516

ABSTRACT:
A plurality of fatigue life test strips (16, 18, 20, 22) has each of the strips anchored to a base (12) which is subject to thermal cycling and consequent dimensional change which causes fatigue. The base is, at best, semiconductive, and the strips are conductive. The conductivity of each of the strips is measured by test circuit (52) so that, when one fails due to fatiguing, the failure is signaled.

REFERENCES:
patent: 3272003 (1966-09-01), Harting
patent: 3738162 (1973-06-01), Dally et al.
patent: 3786679 (1974-01-01), Crites
patent: 3828606 (1974-08-01), Wolter
patent: 4104605 (1978-08-01), Boudreaux et al.
patent: 4590804 (1986-05-01), Brull
patent: 4793189 (1988-12-01), Dell'Orto et al.

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