Thermal control system for a semi-conductor burn-in

Details Thermal control system for a semi-conductor burn-in Thermal control system for a semi-conductor burn-in

1992-10-27

1994-05-24

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

219450, 219516, G01R 3102, H05B 102

Patent

active

053152409

ABSTRACT:
A temperature controller to accurately control the temperature of a device under test (DUT) a heat exchanger in heat exchange relationship with the DUT. A temperature sensor is received within the heat exchange device and thermally isolated therefrom. This temperature sensor measures the temperature of the DUT. A second temperature sensor is received within the heat exchange device and measures the temperature of the heat exchange device. The temperature of the DUT is based on temperature readings from both the sensors.

REFERENCES:
patent: 2806122 (1957-09-01), Thunander
patent: 3153139 (1964-10-01), Sivacek
patent: 4241289 (1980-12-01), Bowling
patent: 4493981 (1985-01-01), Payne
patent: 4968931 (1990-11-01), Littlebury et al.

Affiliated with

Also associated with

Rating

Thermal control system for a semi-conductor burn-in does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Thermal control system for a semi-conductor burn-in, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Thermal control system for a semi-conductor burn-in will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-1975445