Thermal conductivity measurement method and instrument and...

Thermal measuring and testing – Determination of inherent thermal property – Thermal conductivity

Reexamination Certificate

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C374S137000, C073S025030

Reexamination Certificate

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06991366

ABSTRACT:
A method of measuring the heat conductivity of an object to be measured, comprising generating heat between the object to be measured and a heat resistant material, causing heat to flow through the interior of the object to be measured and the interior of the heat resistant material and obtaining the heat conductivity of the object to be measured from a temperature difference between at least two points of the heat resistant material, a heat conductivity measuring instrument using the same and a method of producing a heat insulating material.

REFERENCES:
patent: 3075377 (1963-01-01), Lang
patent: 3114255 (1963-12-01), Niven
patent: 3263485 (1966-08-01), Parviz Mahmoodi
patent: 3657644 (1972-04-01), Beam et al.
patent: 3720103 (1973-03-01), Adams et al.
patent: 3733887 (1973-05-01), Stanley et al.
patent: 3745460 (1973-07-01), Belzer et al.
patent: 3971246 (1976-07-01), Sumikama et al.
patent: 4236403 (1980-12-01), Poppendiek
patent: 4264423 (1981-04-01), Negas et al.
patent: 4553852 (1985-11-01), Derderian et al.
patent: 4630938 (1986-12-01), Piorkowska-Palczewska et al.
patent: 4696578 (1987-09-01), Mansuria et al.
patent: 4896281 (1990-01-01), Mack
patent: 4929089 (1990-05-01), Tsuchida
patent: 5005985 (1991-04-01), Piokkowska-Galeska et al.
patent: 5112136 (1992-05-01), Sakuma et al.
patent: 5251980 (1993-10-01), Hiraoka et al.
patent: 5297868 (1994-03-01), Graebner
patent: 5393351 (1995-02-01), Kinard et al.
patent: 5667301 (1997-09-01), Jurkowski et al.
patent: 5881208 (1999-03-01), Geyling et al.
patent: 5940784 (1999-08-01), El-Husayni
patent: 6039471 (2000-03-01), Wyland
patent: 6183128 (2001-02-01), Beran et al.
patent: 6190039 (2001-02-01), Yaguchi
patent: 6278051 (2001-08-01), Peabody
patent: 6331075 (2001-12-01), Amer et al.
patent: 6663278 (2003-12-01), Chien et al.
patent: 2002/0085615 (2002-07-01), Nakamura et al.
patent: 2003/0072349 (2003-04-01), Osone et al.
patent: 2003/0152132 (2003-08-01), Pipe et al.
patent: 2005/0105584 (2005-05-01), Ichikawa et al.
patent: 2724846 (1978-12-01), None
patent: 61198046 (1986-09-01), None
patent: 62172248 (1987-07-01), None
patent: 01013445 (1989-01-01), None
patent: 4155173 (1992-05-01), None
patent: 5142075 (1993-06-01), None
patent: 7294359 (1995-11-01), None
patent: 2610250 (1997-05-01), None
Thin Film Thermal Conductivity Mater, Amer et al. 1997.
Assessment of heat Flow through Bulk geologic Material, Green et al. Joint Conferences. 1997.
Development of NPL Guarded Hot Plate Emissometer, Stacey et al. Joint Conferences. 1997.

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