Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified electrical sensor or system
Patent
1983-06-29
1985-03-19
Birmiel, Howard A.
Measuring and testing
Specimen stress or strain, or testing by stress or strain...
Specified electrical sensor or system
7386255, 7386263, G01B 530, G01L 114
Patent
active
045051585
ABSTRACT:
A temperature compensated measuring system for measuring linear deformation due to the application of force. Electrical signals produced by a pair of dissimilar metal thermal detectors utilizing a pair of linear variable differential transformers are electrically summed to provide a signal free of thermal influence. Parallel rods of diverse metals are interconnected through one LVDT while a portion of one of the rods is connected to the member to be measured by the other LVDT and the summation of electrical signals permits an electrical thermally compensated readout indicating deformation due to force.
REFERENCES:
patent: 2332288 (1943-10-01), Zeitlin
patent: 2336371 (1943-12-01), Shayne et al.
patent: 2664787 (1954-01-01), Plimmer
patent: 3045510 (1962-07-01), Brainard
patent: 3074175 (1963-01-01), Ludlam
patent: 3236124 (1966-02-01), Rhoades
patent: 3332153 (1967-07-01), Loewen
patent: 3775655 (1973-11-01), DuVall
patent: 3921300 (1975-11-01), Cox et al.
Acer Automation Company
Birmiel Howard A.
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