Thermal box for a semiconductor test system

Details Thermal box for a semiconductor test system Thermal box for a semiconductor test system

1995-10-23

1999-04-06

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

G01R 3102

Patent

active

058923675

ABSTRACT:
Disclosed is a thermal environment enclosure for a semiconductor test system, said enclosure comprising a housing having an exterior surface, an interior chamber and a window therethrough. The housing further comprised of a substantially rectangular top, a pair of substantially rectangular side walls, a front wall, a back wall, a top perimeter edge, and a bottom perimeter edge with an attached sealing gasket. The bottom perimeter edge defines an opening into the interior chamber which is configured for sealed mating with the recessed test area to define a imposed thermal environment test area. The top of the housing comprises a hingeably attached lid with a closing latch, the lid including an attached interior surface sealing gasket defining the interior chamber in combination with other walls when the lid is closed. The housing also includes a flange circumscribing the bottom perimeter edge of the housing, with attachment mounts for removeably attaching the enclosure to the front surface of the semiconductor test system and a seal attached to the flange bottom surface for mating with the front surface of the test system to define a sealed interface between the flange and test system front surface. The enclosure further includes a supply line conduit passing through a side wall into the interior chamber, said conduit including a diffuser outlet located in the interior chamber.

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