Thermal measuring and testing – Differential thermal analysis – Detail of sample holder or support therefor
Patent
1989-10-12
1991-05-07
Yasich, Daniel M.
Thermal measuring and testing
Differential thermal analysis
Detail of sample holder or support therefor
62148, 236 91A, 374 16, 392497, G01N 2500, G01K 120
Patent
active
050131591
ABSTRACT:
Apparatus for controlling the temperature of a sample in a thermal analysis system according to a temperature-control program in order to facilitate the production of rising and falling temperatures. The apparatus includes a first heater, a thermally insulating container having an opening and containing a mass of liquified coolant, a coolant vapor flow pipe, a sample chamber for containing the sample, a second heater, a sample chamber temperature detector, a temperature-control program setting circuit, a first power supply regulator and a second power supply regulator. The first heater is disposed within the liquified coolant in the container and is operated according to a desired temperature-control program set in the setting circuit to vaporize the liquified coolant so that the vaporized coolant is introduced through the pipe and into the sample chamber to cool the interior of the chamber, while the interior of the chamber is heated by the second heater to thereby control the production of rising and falling temperatures in the sample chamber.
REFERENCES:
patent: 3195620 (1965-07-01), Steinhardt, Jr.
patent: 3305000 (1967-02-01), Bullen et al.
patent: 4107937 (1978-08-01), Chmiel
patent: 4117713 (1978-10-01), Phillips et al.
patent: 4314459 (1982-02-01), Rivoire
Nakamura Nobutaka
Take Masafumi
Takeda Haruo
Seiko Instruments Inc.
Yasich Daniel M.
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