Liquid crystal cells – elements and systems – Particular structure – Having significant detail of cell structure only
Reexamination Certificate
2006-06-09
2010-11-09
Nelms, David (Department: 2871)
Liquid crystal cells, elements and systems
Particular structure
Having significant detail of cell structure only
C349S141000, C324S701000
Reexamination Certificate
active
07830484
ABSTRACT:
A TFT substrate for inspection for shorts, includes a substrate defined by a display area and a non-display area outside the display area; a plurality of first and second lines formed in the display area on the substrate; pad lines formed to be extended from one side of each of the first lines to the non-display area; a plurality of signal inspection bars formed in the non-display area to cross the pad lines at one side of the pad lines; a shorting inspection bar spaced apart from the outermost signal inspection bar at a predetermined interval and substantially parallel with the signal inspection bar and connected to the pad lines; and a plurality of transparent electrode patterns partially overlapped with the pad lines and connected to one of the signal inspection bars.
REFERENCES:
patent: 5734450 (1998-03-01), Irie et al.
patent: 2002/0027621 (2002-03-01), Chae
Eom Soung Yeoul
Kang Dong Woo
Kim Bong Chul
Yang Ki Soub
LG Display Co. Ltd.
McKenna Long & Aldridge LLP
Nelms David
Nguyen Lauren
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