Liquid crystal cells – elements and systems – Particular excitation of liquid crystal – Electrical excitation of liquid crystal
Reexamination Certificate
2006-08-29
2006-08-29
Nguyen, Dung T. (Department: 2871)
Liquid crystal cells, elements and systems
Particular excitation of liquid crystal
Electrical excitation of liquid crystal
Reexamination Certificate
active
07098969
ABSTRACT:
The widths of those portions of a semiconductor layer5and a drain line6aoverlapping with it which cross an edge line of a gate electrode2are made smaller than the channel width of a thin-film transistor. With this measure, the overlap area of the gate electrode2and a drain electrode6is reduced. As a result, a variation of the above overlap area due to alignment errors in a photolithography apparatus used in patterning the gate lines2,the drain electrodes6,and source electrodes7can be reduced and the frequency of occurrence of display defects can be decreased.
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Hashiguchi Takafumi
Nakagawa Naoki
Yamaguchi Takehisa
Kabushiki Kaisha Advanced Display
McDermott Will & Emery LLP
Nguyen Dung T.
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