TFT array inspection device

Details TFT array inspection device TFT array inspection device

2007-11-20

2007-11-20

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S758010, C250S310000

Reexamination Certificate

active

10834874

ABSTRACT:
A TFT array inspection device inspects a TFT array substrate having thin film transistors arranged in a matrix pattern. The TFT array inspection device includes a probe frame to be electrically connected to the TFT array substrate. The probe frame includes probe pins contacting array inspection electrodes to be connected to a driving electrode terminal provided in a TFT array on the TFT array substrate through wires. The probe pins are positioned at common locations relative to a layout of the TFT array substrate. Since the probe pins are located at common positions, it is possible to use a single common probe frame for the TFT array substrate with a different layout without providing or changing a prove frame corresponding to a different layout of the TFT array substrate.

REFERENCES:
patent: 6137300 (2000-10-01), Hayashida
patent: 6750926 (2004-06-01), Ohgiichi et al.
patent: 6759867 (2004-07-01), Sohn
patent: 6765203 (2004-07-01), Abel

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